KP Technology have developed a range of modules that feature surface photovoltage and photoemission spectroscopy capabilities.
All of which have been designed to complement our range of Kelvin Probe systems to determine the absolute work function in ambient, controlled gas or vacuum environments.
Ambient Pressure Photoemission Spectroscopy
The Ambient Pressure Photoemission Spectroscopy (APS) systems are KP Technology's newest addition to our large surface analysis range. The dual-mode APS systems measure the absolute work function of a material by photoemission in air, no vacuum is required. These systems hold domestic and international patents.
With an excitation range of 3.4 eV to 7.0 eV, the APS systems can measure the absolute work function of metals (accuracy: 0.05 eV) and the ionisation potential of semiconductors alongside measurement of the surface Fermi level with the Kelvin Probe (accuracy: 0.001 eV).
With the addition of a surface photovoltage (SPV) and surface photovoltage spectroscopy (SPS), the full bands of semiconductors can be measured in one system; no other product can do this.
The latest materials and applications highlighted in published papers includes, Perovskite solar cells, indium zinc tin oxide thin films, diamond electronics, organic solar cells, light-emitting electrochemical cells, organic transistors, alkali oxide thin films and semiconductors.
Download the product brochure for more information on the Ambient Pressure Photoemission Spectroscopy range, including technical specifications, example measurements and add-on options.
Ambient Pressure Photoemission Spectroscopy with Nitrogen Environment
The APS04-N2-RH incorporates a tuneable deep ultra-violet (UV) source outputting 3.4 - 7.0 eV, for absolute work function and highest occupied molecular orbital (HOMO) measurements, a surface photovoltage spectroscopy (SPS) module outputting 400 - 1000 nm for Voc and Eg measurements, together with a 50 x 50 mm scanning area for planar relative work function measurements (Fermi level).
This system allows absolute work function determination in the presence of a nitrogen atmosphere. Our dedicated software allows the user full control of the energy scan ranges, tip potential, signal gain and averaging. Cube or square root fitting of the emission data over user-selectable photon energy, normalised light intensity, and baseline correction.
Download the product brochure for more information on the Ambient Pressure Photoemission Spectroscopy with Nitrogen Environment Kelvin Probe, including technical specifications, example measurements and add-on options.
The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes.
The modules offer a comprehensive range of measurement modes including DC and AC surface photovoltage studies utilising the built-in optical chopper.
Total digital control of all parameters including light intensity and wavelength (400 - 700 nm: SPS030 or 400 - 1000 nm: SPS040) gives the opportunity to investigate and characterise the surface photovoltage and surface photovoltage spectroscopy properties of samples.
The latest materials and applications highlighted in published papers includes, gold films, perovskite solar cells, titanium dioxide nanotubes, dye sensitised solar cells, hybrid organic/inorganic photocathodes and tungsten trioxide.
Download the product brochure for more information on the Surface Photovoltage range, including technical specifications, example measurements and add-on options.