APS04
An introduction to our best-selling APS04 system.
The Ambient-pressure Photoemission Spectroscopy (APS) system measures the absolute work function of a material by photoemission in ambient conditions, no vacuum is required. The excitation range of APS is 3.4 eV to 7.0 eV, meaning that APS is capable of measuring the absolute work function of metals and the ionisation potential of semiconductors alongside measurement of the surface Fermi level with the Kelvin probe.
This system comes with an SPV and SPS source, therefore the full bands of semiconductors can be measured in one complete desktop system; no other product in the world can do this.
Specification
| Kelvin probe 3-axis scanning | ✓ |
|---|---|
| Surface Photovoltage | ✓ |
| Surface Photovoltage Specroscopy | ✓ |
| Tip material / diameter | 2 mm gold tip |
| CPD resolution | 1 - 3 meV |
| Height control (auto) | 25 mm automatic |
| Kelvin probe mode and PE mode | CPD and photoemission measurements |
| CPD measurement time | CPD measurements in <1 minute |
| PE resolution | Full photoemission measurement |
| WF measurement time | PE measurements in <5 minutes |
| DOS measurements | Full access to DOS information |
| Optical system | Colour camera with zoom and monitor for positioning |
| Oscilloscope | Digital TFT oscilloscope for real time signal |
| Test sample | Gold, aluminium, and silver test samples |
| Faraday enclosure base (mm) | 450 x 450 mm optical and Faraday enclosure |
| Control supplied | PC control with dedicated software |
| Patented technology | US:8866505 / GB:2439439 / GB:2495998 / EU:2783205 / JP:6018645 |
