KP Technology Attended 2011 Spring MRS

Professor Iain Baikie and KP Technology invited all to attend the 2011 Spring MRS, which was held in the Moscone Center in San Francisco. For 3 days Professor Baikie displayed a range of Kelvin Probe systems: Scanning Kelvin Probe (SKP5050), Surface Photovoltage (SPV020), Ultra-high Vacuum (UHVKP Corner Cube) and Surface Photovoltage Spectroscopy (SPS030). The exhibition was a resounding success with existing and new clients attending the booth from across the world and across many fields of research. Thank you to all who attended and contacted us.

Back To Top