Ambient Pressure Photoemission Spectroscopy (APS) systems measure the absolute work function (Φ) of a material by photoemission in air. These systems are dual-model and therefore also incorporate the Kelvin probe method to determine the relative work function (ΔΦ). The excitation range of the APS systems is 3.4 eV to 7.0 eV and there are 4 configurations to choose from, all with varying features and capabilities. Our APS04 system comprises all the features: photoemission, 3-axis scanning, surface photovoltage and surface photovoltage spectroscopy. These capabilities allow the full bands of semiconductors to be measured. No other product in the world can achieve this and as such the APS range holds patents in the UK, Europe, Japan and in the US.
Our world-leading range of Kelvin probe and dual-mode Ambient Pressure Photoemission Spectroscopy (APS) systems produce fast and reliable measurements and feature in two peer-reviewed client publications every week. If your research area encompasses semiconductors, solar cells, organic photovoltaics, metals/metal alloys, thin films, perovskites, nanowires or corrosion or if you measure work function, ionisation energy or corrosion potential then our products could benefit you. We are unmatched on accuracy and spatial resolution. The accuracy of our relative work function (ΔΦ) and absolute work function (Φ) measurements are 0.001 eV and 0.005 eV respectively and spatial resolution of our SKP5050 Scanning Kelvin Probe system is 0.05 mm.
"The Kelvin Probe that you developed is wonderful because of the height regulation feature which other systems do not have. We have another company's Kelvin Probe and the KP Technology System is better in sensitivity, ease of use, and customer service." Dr Shinjiro Yagyu National Institute for Materials Science