SKP5050-TS

SKP5050-TS

Specification

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The Scanning Kelvin Probe, SKP5050-TS gives the user full access to 2D and 3D work function plots of samples up to 50mm. With work function resolution of 1-3 meV, and the spatial resolution of the probe tip diameter, this Scanning Kelvin Probe gives reliable, repeatable measurements for work function (Φ) and contact potential difference (CPD) measurements. A Faraday enclosure shields this scanning system from unwanted ambient light, fast changing environmental conditions and electromagnetic interference, it also provides the perfect platform for our Ambient-pressure Photoemission Spectroscopy (APS) and Surface Photovoltage add-on modules.

Tip material / diameterStandard 2 mm gold tip (0.05 mm available on request)
Work function resolution1 - 3 meV
Sample scan size50 x 50 mm
3D sample areaSquare
Height control (auto)25mm
Visualisation3D map of surface potential
Optical systemColour camera with zoom lens and monitor
OscilloscopeDigital TFT oscilloscope for real time signal
Test sampleGold and aluminium test sample
Faraday enclosure base450 x 450 mm
Control suppliedPC control with dedicated software for full control of all parameters
Detection systemOff-null with parasitic capacity rejection
Warranty12 months
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