KP010-TS

KP010-TS

Specification

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The KP010-TS system offers very high-resolution single point DF and surface potential measurements at a frequency of 0.1 – 10 Hz, with measurement duration up to several days. Software includes automatic measurement of Kelvin probe signal, work function, user defined signal and work function averaging, coupled with automatic control of tip-to-sample mean spacing via voice-coil DC offset. It allows rapid probe setup using the integral 25 mm manual translator with our sample approach software. Measurement data can be exported to Excel, Origin, Matlab, etc, or our KPWize Work Function processing software.

Tip diameterStandard 2 mm tip
Work function resolution1 - 3 meV
Faraday Screen
Sample HolderStandard 31 mm sample stub mount
Manual Height Control25 mm high-resolution translator
Automatic Tip Height Control+/- 0.25 mm (DC Offset)
Visualisationwork function/surface potential versus time
Measurement Frequency0.1-10 Hz.
PC24” display, Version 11 system software
Digital TFT OscilloscopeIncluded
Test SampleAluminium/Gold
Digital Control ofTip Amplitude, Frequency, Mean Spacing, Potential
AveragingSignal and Work Function Averaging
Detection SystemKP Technology Off-null with parasitic capacity rejection and Boxcar Integration
System includesSystem Manual, cables
Data Acquisition SystemInternal USB
Warranty2 Years
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