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The Ambient-pressure Photoemission Spectroscopy (APS) systems are one of KP Technology Ltd’s most recent additions to our large surface analysis range. Domestic and international patents are held for these instruments. APS measures the absolute work function (Φ) of a material by photoemission in ambient conditions, no vacuum is required. The excitation range of APS is 3.4 eV to 7.0 eV, meaning that APS can measure the absolute work function of metals and the ionisation potential of semiconductors alongside measurement of the surface Fermi level with the Kelvin probe.

If an SPV and SPS source is added to the APS system, the full bands of semiconductors can be measured in one complete desktop system; no other product in the world can do this.

Find out more about our APS systems here.

Kelvin probe 3-axis scanning
Surface Photovoltage
Surface Photovoltage Specroscopy
Tip material / diameterStandard 2 mm Au plated tip
CPD resolution1 - 3 meV
APS Measurement Resolution0.05eV
Height control (auto)25 mm automatic
Kelvin probe mode and PE modeCPD and photoemission measurements
CPD measurement timeCPD measurements in <1 minute
WF measurement timePE measurements in <5 minutes
Optical systemColour camera with zoom and monitor for positioning
OscilloscopeDigital TFT oscilloscope for real time signal
Test sampleAu/Al and Ag Reference samples
Faraday/optical enclosureAu/Al and Ag Reference samples
Control suppliedPC control with dedicated software
Patented technologyUS:8866505 / GB:2439439 / GB:2495998 / EU:2783205 / JP:6018645
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