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1. What are corrosion chambers usually used for?

2.(i) What is the surface Photovoltage option for and how is it different from your Base, System & Scanning Packages?

2.(ii) What do people use your different SPVs for?

3. Your literature states that you also supply the scanning platform with the SKP5050. Does that mean the regular SKP system does not have the scanning platform?

4. You write that with your SKP5050 package you supply the optical/TFT monitor arrangement to monitor tip-to-sample displacement and tip positioning on the sample. How are these functions achieved in other, not SKP5050 packages?

5. You write that your System Package has tip positioning of 25.4mm. What does that mean? Is the tip that high over the sample?

6. If in KP010 and KP020 the tip is 2mm, does that mean that the lateral resolution is also 2mm? Or is it the length of the tip and why is this important?

7. Does KP010 require that a customer has their own sample mounts?

8. In what situation is the Faraday cage most useful during the KP measurements?

9. What are the lateral resolutions of KP010, KP020, SKP010 and SKP5050?

10. You write that the SKP010 has three motorised axes X,Y & Z. What is the Z axis for?

11. Does the SKP5050 have all the software features of SKP010?

12. What is the main advantage of having SKP5050 over SKP010?

13. Does the GBC030 require a connection to a Nitrogen tank?

14. Can you use KP010, KP020, SKP010 or SKP5050 in a glove box?

15. In SKP250250 what is the third translating dimension (50mm) for?

16. For how long do Gold Coated Reference Samples usually last?

17. I was under the impression that work function should be measured in eV or meV but I have read literature stating ‘work function resolution of 1-3mV’. Is it right?

18. We are testing your SKP instrument to measure the potential on a sample surface. The potential (work function) is a relative, not absolute, value. What is the reference?

19. When exposing our sample to a high RH we find a water layer would form on the surface. We want to know the maximum thickness of the water layer that your instrument can normally work. 0.2 mm, 0.5 mm or 1.0 mm?

20. I am interested in using Kelvin probes to determine information about the grain and grain boundary characteristics (i.e. effective work function due to traps, trap energy and density) of our thin film samples. As I am not familiar with the technology, could you provide some information regarding the application of Kelvin Probes for polycrystalline thin film characterisation.

21. The application I am working with requires a very specific lighting configuration with control of wavelength and interference filters. Can your system accommodate this?

22. If a semiconductor is measured by the Kelvin Probe, is it possible to obtain some information about the valence band edge (HOMO level)?

23. I have just taken over the use of the Kelvin Probe in our lab to measure my silicon sample. Unfortunately for some reason after only measuring 100 points a warning message comes up and the measuring process is terminated. I can not get a reliable result at only 100 measuring points. Could you please help me resolve the problem?

24. What would a typical sample to tip distance be during a KP measurement?

25. What are the vacuum requirements for KP? Is it a UHV only technique?

26. Is the technique sensitive to sub-monolayer changes in surface composition, or is it more appropriate for studying "thicker" thin films?

Can't find the solution to your problem here?

If you are looking for advice or information on our Kelvin Probe who better to ask than its inventor and longest user. ASK PROFESSOR BAIKIE

Special thanks to:

Professor Lukasz Brzozowski, The University of Toronto, Canada.
Helix Shao, Cross-Tech Development, China
Jiahe Ai, University of Viriginia, USA
Jeong Hee Han, Senior Researcher, Samsung Electronics

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