Ambient Pressure Photoemission SpectroscopyAPS04: Scanning, surface photovoltage and surface photovoltage spectroscopy capabilities
The Ambient Pressure Photoemission Spectroscopy (APS) systems are KP Technology's newest addition to our large surface analysis range. The dual-mode APS systems measure the absolute work function of a material by photoemission in air, no vacuum is required. These systems hold domestic and international patents.
With an excitation range of 3.4 eV to 7.0 eV, the APS systems are capable of measuring the absolute work function of metals (accuracy: 0.05 eV) and the ionisation potential of semiconductors alongside measurement of the surface Fermi level with the Kelvin probe (accuracy: 0.001 eV).
With the addition of a surface photovoltage (SPV) and surface photovoltage spectroscopy (SPS), the full bands of semiconductors can be measured in one system; no other product can do this.
Latest materials and applications from publications
Perovskite solar cells, indium zinc tin oxide thin films, diamond electronics, organic solar cells, light-emitting electrochemical cells, organic transistors, alkali oxide thin films, semiconductors.