KP Technology to Attend 2009 Fall MRS
We will be exhibiting our very popular SKP5050 Scanning Kelvin Probe System (with new optical enclosure for Surface Photovoltage (SPV) measurement) and our Ultra-high Vacuum UHVKP020 Kelvin Probe with new mini analysis chamber.
We would be delighted to perform work function measurements on your conducting or semi-conducting samples to arrange a specific appointment to view our equipment range please contact us.
Professor Baikie will also be providing a free workshop:
'Introduction to the Kelvin Probe for High Resolution Work Function Measurements'
on Tuesday 1st December 2.30 - 3.30pm in Exhibit Hall C (Opposite Career Centre) Register for this seminar here.
See details here MRS Invitation
|Written by Dr Rachel Sheridan Published on 20 November 2009|