Following the success of the Boston meeting we will be exhibiting our equipment for the convinience of those customers on the West Coast at the Spring, San Francisco, meeting. You will have the chance
to see, first hand, our Scanning Kelvin Probe System (with new optical enclosure for Surface Photovoltage (SPV)
measurement) and our Ultrahigh Vacuum
UHV KP020 Kelvin Probe with new mini analysis
chamber.
It is also an opportunity to bring along your own conducting or semi-conducting samples for a demonstration of work function measurements.
To arrange a specific appointment to view our equipment range contact:
iain@kelvinprobe.com
Prof Baikie will also be providing a free hands on workshop at the booth: Details to follow
KP Technology Webinar, World Wide Broadcast February 2010 - Update
Confirmed Speakers:
Dr. Greg Lopinski, Biomolecular
Sensing & Imaging Group, Steacie Institute, National Research
Council of Canada
"Organic Monolayers on Semiconductors"
Prof. Dongyang Li, Department of Chemical and Materials
Engineering, University of Alberta, Canada
"Corrosion and Surface Photovoltage"
Mr. AJ Cooper, Graduate Research
Assistant, Molecular Electronics Group, University of Virginia
KP Technology Webinar, World Wide Broadcast February 2010
Professor Iain Baikie in conjunction with the publication 'Thin Solid Film' will be heading up an expert panel presenting an educational webinar introducing viewers
to the principle of the Kelvin Probe technique,
explaining how it works, the information it provides
and how this can be interpreted through the use of
examples and typical applications in Materials Science.
Attendees will discover the advantages this highly sensitive research tool can offer and will also have an opportunity
to ask any questions relevant to the Kelvin Probe technique
and their current research requirements.
Prof Baikie and invited guests will present:
Introduction to the Traditional Kelvin Probe for
High Resolution Work Function Measurements on
Thursday 25th February
4.00pm - 5.00pm GMT /11.00am-12.00pm EST
We would like to thank everyone who came to visit us at the event. It was a very enjoyable and successful meeting.
For those who missed it and those who would like to review it's content Prof. Baikie has added his Seminar Notes to the website.
Fall MRS, Boston, USA December 2009
We will be exhibiting our very popular SKP5050
Scanning Kelvin Probe System (with new optical
enclosure for Surface Photovoltage (SPV)
measurement) and our Ultrahigh Vacuum
UHV KP020 Kelvin Probe with new mini analysis
chamber.
We would be delighted to perform work
function measurements on your conducting or
semi-conducting samples to arrange a specific
appointment to view our equipment range contact:
iain@kelvinprobe.com
Prof Baikie will also be providing a free workshop:
Introduction to the Kelvin Probe for High
Resolution Work Function Measurements on
Tueday 1st December 2.30 - 3.30pm in Exhibit Hall C
(Opposite Career Centre)
Register for this seminar here:
Registration
Collaborative Abstract Submitted to ICANS23 August 2009
ECN Solar Energy and KP Technology Ltd have had collaborative abstract "In-situ measurements of surface (photo)voltage of roll-to-roll deposited thin film silicon solar cells" accepted for presentation at the 23rd International Conference on Amorphous and Nanocrystalline
Semiconductors in Utrecht.
This years EMRS conference in Strasbourg was a great success. Thanks to all who visited our stand. For those of you who would like to visit us at the next conference the details will be posted here soon.
E-MRS, Strasbourg, France June 2009
KP Technology will exhibit at the E-MRS in Strasbourg between June 9 – 11 2009. Come and visit us at booth #27. Bring along your own material samples and let us show you how the SKP5050 or our other ambient and UHV Kelvin Probes can work for you.
Professor Iain Baikie nominated for Highlands & Islands Regional Director of the Year February 2009
Professor Baikie has been nominated by Highlands and Islands Enterprise for the Highlands & Islands Regional Director of the year award in the prestigious Institute of Directors Awards for 2009.
KP Technology wins John Logie Baird Award December 2008
KP Technology are honoured to have won the John Logie Baird Award for Impact Through Innovation. The Award was presented to Professor Iain Baikie at a gala dinner in Glasgow on the 10th of December 2008.
Returning after a 5-year absence, the Awards, run by Glasgow Opportunities and Malcolm Baird, the son of John Logie Baird, were launched in the Scottish Parliament in June 2008.
KP Technology will demonstrate the unique ‘Baikie System’ Scanning Kelvin Probe SKP5050 at this years Fall Materials Research Society meeting. Visit us at booth #1201 between 1 – 4 December 2008.
European Space Agency awards KP Technology contract for Kelvin Probe project August 2008
KP Technology, have been awarded a contract with the European Space Agency to increase the system capabilities of the Kelvin Probe in order to meet the requirements for their latest research into bimetallic or galvanic corrosion.
The European Space Agency (ESA) is Europe’s gateway to space. Composed of 17 member states the ESA is responsible for the co-ordination and implementation of the European Space programme.
KP Technology has won the Kelvin Probe contract through the opportunities provided by the European Space Agency SME Initiative.
The European Space Agency’s programmes are designed to find out more about Earth, its immediate space environment, our Solar System and the Universe. ESA also work hard to develop satellite based technologies and services.
The avoidance of galvanic corrosion in the development of satellites is a major standard requirement for the ESA and
recent investigations of the galvanic compatibility of different metals have called upon the use of a Kelvin Probe to further understand the properties of the metallic materials that are used in space.
Professor Iain D Baikie, Director of KP Technology said “We are delighted with the award of this research contract by an existing customer. Through this program of research we aim to enhance our system capabilities, allowing KP Technology to enter new markets. The ESA contract will permit us to develop and trial several new technologies which will act as prototypes in areas other than corrosion including forensics and bio-technology.”
To learn more about using the Kelvin Probe for corrosion measurements take a look at the following publication:
Behaviour of a zinc–iron bimetallic couple coated with poly-vinyl butyral lacquer during intermittent exposure to salt solution
KP Technology Ltd will exhibit at the European Conference on Surface Science being held at Liverpool University between 28th and 31st July 2008.
KP Technology Ltd wins a Queens Award April 2008
KP Technology Ltd, has been awarded the prestigious Queen’s Award for Enterprise: Innovation 2008, for research, design and manufacture of Kelvin Probes. The Queen's Awards for Enterprise is an awards programme for businesses who excel at international trade, innovation or sustainable development. They are the highest official UK awards for British businesses. To be awarded the Queen's Award for Enterprise in the category of Innovation, businesses must be able to demonstrate substantial improvement in business performance and commercial success, to levels that are outstanding for the size of the applicant's operations.
Fall MRS Meeting, Boston, MA December 2007
KP Technology will demonstrate the Scanning Kelvin Probe SKP5050 at this years Fall Materials Research Society meeting. To find out more or for a demonstration of the unique ‘Baikie System’ Kelvin Probe visit us at booth #1207.
Visit www.mrs.org for more information
KP Technology Ltd wins Highlands and Islands Business Award November 2007
KP Technology Ltd, received the award for ‘Best Innovation’ at this years Highlands and Islands Business Awards.
The awards which were sponsored by Ernst and Young, The Press and Journal, Highlands and Islands Enterprise, The Highland Council, BT Scotland and Highland Opportunity were presented by Bob McDowell, vice-president of Microsoft on Monday November 5th 2007 at a lunchtime ceremony in the Drumossie Hotel in Inverness.
The award was collected by Professor Iain Baikie, Director of KP Technology, he said “we are delighted to be the recipients of this prestigious award and are most grateful for David Taylor at the Bank of Scotland, Wick, for nominating our company for this award. It was clear from the presentation ceremony that business innovation in the Highlands and Islands region is very strong and our competition included many companies which are significantly larger. Of all the prizes on offer this was the one that best fits the company profile and our aspirations for business growth”.
ISSC 16, St Andrews June 2007
KP Technology will exhibit the Scanning Kelvin Probe between 25th and 28th June 2007 at this years Interdisciplinary Surface Science Conference. For more information or to book a demonstration contact us at nicola@kelvinprobe.com
Fall MRS Meeting, Boston, MA November 2006
KP Technology will be demonstrating the unique height regulating "Baikie System" SKP5050 Scanning Kelvin Probe at this years fall MRS in Boston from Nov 28-30th. Come and visit us at booth #1206. Bring along your own material samples and let us show you how this SKP or our other ambient and UHV Kelvin Probes can work for you.
KP Technology Ltd wins SCDI HIE Research & Development Award September 2006
KP Technology Ltd has been recognised at the Highland and Islands’ leading business awards ceremony for developing and exporting new measurement systems.
KP Technology collected the Highlands and Islands Enterprise Award for Excellence in Research and Development at the Scottish Council for Development and Industry (SCDI) Highlands and Islands Dinner and Awards ceremony which took place on Friday 15th September 2006 at the Highland Conference Centre in Nairn.
